Presentation: Challenges and Innovations in Nano‐CMOS Transistor Scaling
Intel’s Tahir Ghani reviews traditional scaling, modern innovations, and future challenges and options for Nano‐CMOS Transistor Scaling
• Traditional Scaling Limiters
• Intel’s Response
Post Traditional-Scaling Innovations
• Mobility Booter: Uniaxial Strain
• Poly Depletion Elimination: Metal Gate
• Gate Leakage Reduction: HiK
Future Challenges and Options
•Potential New Transistor Structures and Materials
Read the full Challenges and Innovations in Nano‐CMOS Transistor Scaling Presentation.
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