AN 958: Board Design Guidelines

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ID 683073
Date 6/26/2023
Public
Document Table of Contents
Document Table of Contents x
1. Power Distribution Network 2. Gigahertz Channel Design Considerations 3. PCB and Stack-Up Design Considerations 4. Device Pin-Map, Checklists, and Connection Guidelines 5. General Board Design Considerations/Guidelines 6. Memory Interfacing Guidelines 7. Power Dissipation and Thermal Management 8. Tools, Models, and Libraries 9. Reference Designs and Development Kits 10. Document Revision History for AN 958: Board Design Guidelines
1. Power Distribution Network x
1.1. Target Impedance Decoupling Method 1.2. Voltage Regulator Selection 1.3. PDN Design Tool 1.4. Plane Capacitance 1.5. Minimization Parasitic Inductances 1.6. Additional Resources
1.1. Target Impedance Decoupling Method x
1.1.1. FDTIM Decoupling Concepts 1.1.2. Select Decoupling CAPS to Meet ZTARGET
1.1.1. FDTIM Decoupling Concepts x
1.1.1.1. Determining the ZTARGET 1.1.1.2. Determining the fTARGET
1.5. Minimization Parasitic Inductances x
1.5.1. VRM 1.5.2. Decaps 1.5.3. Mounting Inductance 1.5.4. Spreading Inductance 1.5.5. Inter-Plane Capacitance 1.5.6. Conclusion
2. Gigahertz Channel Design Considerations x
2.1. Material Selection and Loss 2.2. Routing Guidelines for Gigabit Channel Designs 2.3. Minimizing Adverse Effects of Material Glass Fiber Weaves 2.4. Plane Cut-outs Below Surface Mount Pads 2.5. Transmitter Pre-Emphasis and Receiver Equalization 2.6. Additional Resources
2.2. Routing Guidelines for Gigabit Channel Designs x
2.2.1. Via Optimization Techniques
2.2.1. Via Optimization Techniques x
2.2.1.1. General Routing Guidelines
3. PCB and Stack-Up Design Considerations x
3.1. Material Selection and Loss 3.2. Board Thickness and Vias 3.3. PCB Recommended Layout Footprint Land Pattern
4. Device Pin-Map, Checklists, and Connection Guidelines x
4.1. High Speed Board Design Advisor 4.2. Complete Pin Connection Table by Device 4.3. Pin Connection Guidelines By Device 4.4. Design for Debug with JTAG Pins 4.5. Hot Socketing, POR and Power Sequencing Support 4.6. Implementing OCT 4.7. Unused I/O Pins Guidelines 4.8. Device Breakout Guidelines 4.9. Additional Resources
5. General Board Design Considerations/Guidelines x
5.1. Board Design Process Overview 5.2. Design Security Features in FPGAs 5.3. EMI 5.4. Discrete Component Selection for High-Speed Design 5.5. S-Parameters 5.6. Smith Chart 5.7. AC Versus DC Coupling 5.8. Additional Resources
5.1. Board Design Process Overview x
5.1.1. Material Selection and Loss 5.1.2. Cross Talk Minimization 5.1.3. Power Filtering/Distribution 5.1.4. Unused I/O Pins 5.1.5. Signal Trace Routing 5.1.6. Ground Bounce 5.1.7. Understanding Transmission Lines 5.1.8. Impedance Calculation 5.1.9. Coplanar Wave Guides 5.1.10. Simultaneous Switching Noise Guidelines
5.1.3. Power Filtering/Distribution x
5.1.3.1. Filtering Noise 5.1.3.2. Distributing Power
5.1.5. Signal Trace Routing x
5.1.5.1. Single Ended Trace Routing 5.1.5.2. Differential Trace Routing 5.1.5.3. Skew Minimization 5.1.5.4. Termination Schemes 5.1.5.5. Termination Design Example 5.1.5.6. Discontinuities Related to a Transmission Path
5.1.5.4. Termination Schemes x
5.1.5.4.1. Simple Parallel Termination 5.1.5.4.2. Thevenin Parallel Termination 5.1.5.4.3. Active Parallel Termination 5.1.5.4.4. Series-RC Parallel Termination 5.1.5.4.5. Series Termination 5.1.5.4.6. Differential Pair Termination 5.1.5.4.7. On-Chip Termination
5.1.5.5. Termination Design Example x
5.1.5.5.1. Determine the Delay 5.1.5.5.2. Determine the Bandwidth 5.1.5.5.3. Using Series Termination 5.1.5.5.4. Using Parallel Termination
5.1.5.6. Discontinuities Related to a Transmission Path x
5.1.5.6.1. Inductive Discontinuity 5.1.5.6.2. Capacitive Discontinuity 5.1.5.6.3. Via Discontinuity 5.1.5.6.4. Right-Angle Bends Related to a Transmission Path
5.1.6. Ground Bounce x
5.1.6.1. Design Guidelines 5.1.6.2. Analyzing Ground Bounce 5.1.6.3. Switching Outputs 5.1.6.4. Quiet Outputs 5.1.6.5. Minimizing Lead Inductance
5.1.8. Impedance Calculation x
5.1.8.1. Microstrip Impedance 5.1.8.2. Stripline Impedance 5.1.8.3. Propagation Delay
5.1.8.3. Propagation Delay x
5.1.8.3.1. Microstrip Layout Propagation Delay 5.1.8.3.2. Stripline Layout Propagation Delay
5.1.9. Coplanar Wave Guides x
5.1.9.1. Simple Coplanar Wave Guide 5.1.9.2. Grounded Coplanar Wave Guide 5.1.9.3. Grounded Differential Coplanar Wave Guide
5.4. Discrete Component Selection for High-Speed Design x
5.4.1. Resistors and Capacitors 5.4.2. Inductors and Ferrite Beads 5.4.3. SMA Connectors
6. Memory Interfacing Guidelines x
6.1. DDR3 Board Design Guidelines 6.2. DDR2 Board Design Guidelines 6.3. DDR Board Design Guidelines 6.4. QDR II and QDR II+ 6.5. RLDRAM II 6.6. Additional Resources
7. Power Dissipation and Thermal Management x
7.1. Power Management Guidelines 7.2. Heat Sinking and Thermal Managment for FPGAs 7.3. Additional Resources
8. Tools, Models, and Libraries x
8.1. Design Tools 8.2. I/O Buffer Models 8.3. Device Libraries 8.4. Net Length Reports 8.5. Thermal Models
9. Reference Designs and Development Kits x
9.1. Development Kits
1. Power Distribution Network
2. Gigahertz Channel Design Considerations
3. PCB and Stack-Up Design Considerations
4. Device Pin-Map, Checklists, and Connection Guidelines
5. General Board Design Considerations/Guidelines
6. Memory Interfacing Guidelines
7. Power Dissipation and Thermal Management
8. Tools, Models, and Libraries
9. Reference Designs and Development Kits
10. Document Revision History for AN 958: Board Design Guidelines

5.1.5.6.2. Capacitive Discontinuity

This section discusses the effects of capacitive discontinuity, which usually occurs when components are introduced on the transmission path.

The two connector plots in Figure 56 show capacitive loads, one acting as a lower capacitive discontinuity and the other as higher capacitive discontinuity. The capacitance (C) for the load can be calculated with the equation:

A 3.125-Gbps signal (a pseudo random binary sequence (PRBS) pattern) is sent through the first connector that looks like a lower-capacitive connector (1.2 pF); the eye opening and jitter are observed on the other end.

Figure 56. Lower- and Higher-Capacitive Load Connectors Illustrating the Effects of Capacitive Discontinuity

Figure 57 shows the eye opening with the connector that induces a discontinuity of 1.2 pF. The eye opening is a 330-mV differential. The expanded view of the eye shows the peak-to-peak jitter as approximately 27 ps.

Figure 57. Lower-Capacitance Connector Eye Opening and Expanded View of the Eye Opening

Figure 57 shows a 3.125-Gbps PRBS pattern sent through the second connector that looks like a higher-capacitive connector; the eye opening and jitter are observed on the other end.

Figure 58 shows the eye opening for the same signal passing through an SMA connector with a capacitance of 2.9 pF. The eye opening is approximately 280 mV, differential. The expanded view of the eye opening shows that the peak-to-peak jitter is 43 ps.

Figure 58. Higher-Capacitance Connector Eye Opening and Expanded View of the Eye Opening
You should avoid adding connectors and components on the transmission path whenever possible. However, if connectors are required, select ones that creates the least amount of inductive and/or capacitive discontinuity on the transmission path. The jitter and amplitude impact on a 3.125-Gbps signal when transmitting through a 2.9 and 1.2 pF capacitor is very significant. The eye opening shows an amplitude difference of 50 mV, and the expanded view shows a peak-to-peak jitter difference of 16 ps.
  • ρ = RC = (Z0C/2)
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